09202017Wed
Last updateSun, 16 Apr 2017 11am

National Instruments announces High-Speed, High-Resolution, High-Voltage Oscilloscope

National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.

“PXI oscilloscopes from NI reduce test time, increase channel density, and now, deliver even better measurement flexibility with the combination of high bandwidth, resolution and input voltage,” said Steve Warntjes, vice president of R&D at NI. “Our new PXIe-5164 oscilloscope can make some measurements that box instruments today just can’t handle. If you want to measure a high-voltage signal of up to 100 Vpp at up to 1 GS/s, you can now use the same instrument to see small signal details that would normally be hidden by the noise of the instrument thanks to the 14-bit ADC.”

The PXIe-5164 features:

  • Two 14-bit channels sampled at 1 GS/s with 400 MHz bandwidth
  • Two Category II-rated channels with voltage input range to 100 Vpp with programmable offsets allowing measurements up to ± 250 V
  • Up to 34 channels to build parallel, high-channel-count systems in a compact form factor in a single PXI chassis
  • A 3.2 GB/s streaming data rate enabled by 8 lanes of PCI Express Gen 2 bus communication
  • A Xilinx Kintex-7 410 FPGA to create custom IP, including filtering or triggering, programmed through LabVIEW